Naïve - ??
Toyota engineer Ogawa interview with U.S. House investigators in 2010. Mr. Ogawa was warned by House counsel at the start of this interview that untrue answers carry criminal liability.
From Michel Mardiguian,
of Paris, France, renowned EMC expert who often works for the auto
industry:
“Electromagnetic interference leaves no trace, it goes away just as it came.” “An automaker who declares bluntly that uncontrolled acceleration cannot be caused by electromagnetic interference because they have fully tested their vehicle is a liar, or naïve.
“Electromagnetic interference leaves no trace, it goes away just as it came.” “An automaker who declares bluntly that uncontrolled acceleration cannot be caused by electromagnetic interference because they have fully tested their vehicle is a liar, or naïve.
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Also:
From Ron Brewer, NARTE
Certified EMC Engineer, IEEE EMC Society Distinguished Lecturer. Ron
works on the EMC of the Space Shuttle and other space vehicles.
“…there is no way by testing to duplicate all the possible combinations of frequencies, amplitudes, modulation waveforms, spatial distributions, and relative timing of the many simultaneous interfering signals that an operating system may encounter. As a result, it’s going to fail.”
“…there is no way by testing to duplicate all the possible combinations of frequencies, amplitudes, modulation waveforms, spatial distributions, and relative timing of the many simultaneous interfering signals that an operating system may encounter. As a result, it’s going to fail.”
From Alexandre Boyer,
et al
“Although electronic components must pass a set of EMC tests to (help) ensure safe operations, the evolution of EMC over time is not characterized and cannot be accurately forecast.”
“Although electronic components must pass a set of EMC tests to (help) ensure safe operations, the evolution of EMC over time is not characterized and cannot be accurately forecast.”
From Dr I D Flintoff
“As indicated in [2] narrow-band threat fields with simple modulations are no longer necessarily representative of the EMI which causes the failure in digital systems.”
(Note: “narrow-band threat fields with simple modulations” is exactly how automotive radiated immunity testing is done.)
“As indicated in [2] narrow-band threat fields with simple modulations are no longer necessarily representative of the EMI which causes the failure in digital systems.”
(Note: “narrow-band threat fields with simple modulations” is exactly how automotive radiated immunity testing is done.)
From IEC TS 61000-1-2,
Ed 2, December 2008
“In most cases there is no simple or practicable way to check and to verify by means of testing or measuring that immunity is achieved for the safety-related system in its entirety with respect to other systems, equipment or the external electromagnetic environment for all operating conditions and operating modes.”
“This is due to the fact that not every combination of operating conditions, of operating modes and of electromagnetic phenomena acting on the system can be achieved in a reasonable way and in a reasonable period.”
“In most cases there is no simple or practicable way to check and to verify by means of testing or measuring that immunity is achieved for the safety-related system in its entirety with respect to other systems, equipment or the external electromagnetic environment for all operating conditions and operating modes.”
“This is due to the fact that not every combination of operating conditions, of operating modes and of electromagnetic phenomena acting on the system can be achieved in a reasonable way and in a reasonable period.”
For a detailed explanation of why EMC testing cannot be sufficient (i.e. on its own) to demonstrate that EMI in the operating environment cannot be a cause of unacceptable functional safety risks, read the first chapter in the IET’s 2008 Guide.[34]
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With attribution and special thanks to EurIng Keith Armstrong, the indomitable genius of functional safety and EMC standards who is one of Toyota's target experts in the very extensive subpoena documents request list, and also to his colleagues Drs. Anderson and Kirk, his co-authors of a paper on automotive electronics safety. More about that tomorrow.
